Supply And Installation Of An Electronic Scanning Microscope With Fib (focused Ion Beam), X -ray Analysis System And Mass Ablation System Of Material By Clustered Laser, Destined For The Institute Of Microelectronics Of Seville Of The State Agency Higher
TK ID 516485421
Document Type
Tender Notice
Tender Summary
Supply And Installation Of An Electronic Scanning Microscope With Fib (focused Ion Beam), X -ray Analysis System And Mass Ablation System Of Material By Clustered Laser, Destined For The Institute Of Microelectronics Of Seville Of The State Agency Higher