Contract Awarded For Sic Substrate Wafer Dislocation Defect Optical Non-destructive Testing Equipment
sic Substrate Wafer Dislocation Defect Optical Non-destructive Testing Equipment Tankeblue Semiconductor Co., Ltd.
2026-06-02 14:00 2026-06-04 11:09 - 2
TK ID 530484090
Document Type
Contract Awards
Tender Summary
Contract Awarded For Sic Substrate Wafer Dislocation Defect Optical Non-destructive Testing Equipment
sic Substrate Wafer Dislocation Defect Optical Non-destructive Testing Equipment Tankeblue Semiconductor Co., Ltd.
2026-06-02 14:00 2026-06-04 11:09 - 2
Action Deadline
09 Sep 2026