Contract Awarded For Multi-channel Wafer Surface Defect Scanner
multi-channel Wafer Surface Defect Scanner Clp Compound Semiconductor Co., Ltd
2025-12-10 14:00 2025-12-29 11:50 - 2026-01-04 23:59 2026-01-05 09:39.multi-channel Wafer Surface Defect Scanne
TK ID 523592905
Document Type
Contract Awards
Tender Summary
Contract Awarded For Multi-channel Wafer Surface Defect Scanner
multi-channel Wafer Surface Defect Scanner Clp Compound Semiconductor Co., Ltd
2025-12-10 14:00 2025-12-29 11:50 - 2026-01-04 23:59 2026-01-05 09:39.multi-channel Wafer Surface Defect Scanne
Action Deadline
05 Apr 2026