Contract Awarded For Fib / Tem Ga Focused Ion Beam Instrument And Transmission Electron Microscope
the Two Instruments Shall Warrant A Smooth Workflow For Tem Sample Preparation By Fib And State-of-the-art Sample Characterization By Analytical, High-resol
TK ID 519391755
Document Type
Contract Awards
Tender Summary
Contract Awarded For Fib / Tem Ga Focused Ion Beam Instrument And Transmission Electron Microscope
the Two Instruments Shall Warrant A Smooth Workflow For Tem Sample Preparation By Fib And State-of-the-art Sample Characterization By Analytical, High-resol