📋 Tender Overview
Contract awarded for X-ray diffraction equipment lot-0000, title: default lot, description: x-ray diffraction equipment, intended for the non-destructive characterization of synthesized materials, in order to determine the crystalline structure and microstructural parameters. this will allow the analysis of a wide range of materials (thin films, powders, liquid suspensions, membranes), being used for applications such as phase identification and analysis, rietveld refinement, microstructural analysis, reflectivity measurements, reciprocal space mapping, and determination of residual stress. the equipment will be part of a prototyping line for "microfabrication of semiconductor devices", within the pnts project – "national platform for semiconductor technologies". the equipment must ensure high-resolution measurements, flexibility in experimental configuration, and be equipped with detection systems, analysis software, and mechanisms for safe operation. estimated value excluding vat: 3289000.00 ron.X-ray diffraction equipment
